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17. Influence of adsorbates on UV-pulsed laser melting of Si in ultra-high vacuum, Dragnea, B.; Boulmer, J.; Debarre, D.; Bourguignon, B. Applied Physics A: Materials Science & Processing, 73(5), 609-613 (2001).

17. Influence of adsorbates on UV-pulsed laser melting of Si in ultra-high vacuum, Dragnea, B.; Boulmer, J.; Debarre, D.; Bourguignon, B. Applied Physics A: Materials Science & Processing, 73(5), 609-613 (2001).

16. Growth of a SiC layer on Si(100) from adsorbed propene by laser melting, Dragnea, Bogdan; Boulmer, Jacques; Debarre, Dominique; Bourguignon, Bernard. Applied Physics A: Materials Science & Processing, 73(5), 609-613 (2001).

16. Growth of a SiC layer on Si(100) from adsorbed propene by laser melting, Dragnea, Bogdan; Boulmer, Jacques; Debarre, Dominique; Bourguignon, Bernard. Applied Physics A: Materials Science & Processing, 73(5), 609-613 (2001).

15. Chemical mapping of patterned polymer photoresists by near-field infrared microscopy. Dragnea, B.; Preusser, J.; Szarko, J. M.; McDonough, L. A.; Leone, S. R.; Hinsberg, W. D; Applied Surface Science,175-176, 783-789 (2001).

15. Chemical mapping of patterned polymer photoresists by near-field infrared microscopy. Dragnea, B.; Preusser, J.; Szarko, J. M.; McDonough, L. A.; Leone, S. R.; Hinsberg, W. D; Applied Surface Science,175-176, 783-789 (2001).

14. Advances in submicron infrared vibrational band chemical imaging, Dragnea, Bogdan; Leone, Stephen R. International Reviews in Physical Chemistry, 20(1), 59-92 (2001).

14. Advances in submicron infrared vibrational band chemical imaging, Dragnea, Bogdan; Leone, Stephen R. International Reviews in Physical Chemistry, 20(1), 59-92 (2001).

13. Pattern characterization of deep-ultraviolet photoresists by near-field infrared microscopy, Dragnea, Bogdan; Preusser, Jan; Szarko, Jodi M.; Leone, Stephen R.; Hinsberg, William D. Journal of Vacuum Science & Technology, B: 13. Microelectronics and Nanometer Structures, 19(1), 142-152 (2001).

13. Pattern characterization of deep-ultraviolet photoresists by near-field infrared microscopy, Dragnea, Bogdan; Preusser, Jan; Szarko, Jodi M.; Leone, Stephen R.; Hinsberg, William D. Journal of Vacuum Science & Technology, B: 13. Microelectronics and Nanometer Structures, 19(1), 142-152 (2001).

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